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dual beam focused ion beam fib system  (Thermo Fisher)


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    Thermo Fisher dual beam focused ion beam fib system
    Dual Beam Focused Ion Beam Fib System, supplied by Thermo Fisher, used in various techniques. Bioz Stars score: 96/100, based on 1953 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/dual beam focused ion beam fib system/product/Thermo Fisher
    Average 96 stars, based on 1953 article reviews
    dual beam focused ion beam fib system - by Bioz Stars, 2026-03
    96/100 stars

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    Thermo Fisher focused ion beam fib equipment
    a Surface images obtained by helium-ion microscope (HIM) with different magnifications; b Side-view SEM images; c 3D patterns of the stainless-steel samples before and after laser filament processing; d CA and RA results; e Images of ( e i ) the LH304 sample prepared by <t>FIB,</t> ( e ii ) <t>dark-field</t> <t>TEM,</t> and ( e iii ) HRTEM (Inset: fast Fourier transform (FFT) pattern). f EDS of O, Ni, Fe and Cr elements
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    a Surface images obtained by helium-ion microscope (HIM) with different magnifications; b Side-view SEM images; c 3D patterns of the stainless-steel samples before and after laser filament processing; d CA and RA results; e Images of ( e i ) the LH304 sample prepared by FIB, ( e ii ) dark-field TEM, and ( e iii ) HRTEM (Inset: fast Fourier transform (FFT) pattern). f EDS of O, Ni, Fe and Cr elements

    Journal: Light, Science & Applications

    Article Title: Significant reduction of corrosion of stainless steel by strong-field laser surface passivation

    doi: 10.1038/s41377-025-01952-5

    Figure Lengend Snippet: a Surface images obtained by helium-ion microscope (HIM) with different magnifications; b Side-view SEM images; c 3D patterns of the stainless-steel samples before and after laser filament processing; d CA and RA results; e Images of ( e i ) the LH304 sample prepared by FIB, ( e ii ) dark-field TEM, and ( e iii ) HRTEM (Inset: fast Fourier transform (FFT) pattern). f EDS of O, Ni, Fe and Cr elements

    Article Snippet: The thin slices for TEM test were cut by a focused ion beam (FIB) equipment (FEI, Scios2).

    Techniques: Microscopy